Multimodal microscopy using ‘half and half’ contact mode and ultrasonic force microscopy
نویسندگان
چکیده
منابع مشابه
Multimodal microscopy using 'half and half' contact mode and ultrasonic force microscopy.
Advances in the design and fabrication of multifunctional nanostructured materials require characterization techniques capable of simultaneously mapping multiple material properties with nanoscale resolution. We show that this can be achieved by combining nanomechanical information from ultrasonic force microscopy (UFM) with simultaneously acquired friction force and conductivity measurements f...
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Noise reduction has been accomplished in atomic force microscopy by applying a high frequency, low amplitude vibration to the cantilever while it is in contact with a surface. The applied excitation ~.200 kHz; ;1 nm! is acoustically coupled to the tip and dampens the resonance Q factors of the system. The applied frequency is well above the bandwidth of the acquisition system ~50 kHz!. We call ...
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ژورنال
عنوان ژورنال: Nanotechnology
سال: 2014
ISSN: 0957-4484,1361-6528
DOI: 10.1088/0957-4484/25/33/335708